UV-Vis-NIR Spectrophotometer
Product Overview
UV-Vis-NIR Spectrophotometer
The UV-Vis-NIR Spectrophotometer is an advanced analytical instrument developed for accurate optical characterization and spectroscopic analysis across ultraviolet, visible, and near-infrared wavelength regions. The system enables precise measurement of absorbance, transmittance, reflectance, and related optical properties for a wide variety of materials with high sensitivity, stability, and repeatability.
Utilizing advanced optical components, precision monochromator systems, and high-performance detector technologies, the instrument delivers reliable spectral acquisition over a broad wavelength range. Its versatile configuration supports analysis of liquids, powders, thin films, coatings, glass, polymers, semiconductors, nanomaterials, textiles, and other solid or transparent materials used in research and industrial applications.
The system is designed to support multiple measurement techniques including direct transmission, diffuse reflectance, total reflectance, quantitative analysis, kinetics studies, and material characterization. Integrated automation features and intelligent software provide efficient instrument control, real-time spectral acquisition, advanced data processing, graphical analysis, and customizable report generation.
Engineered for modern laboratory environments, the UV-Vis-NIR Spectrophotometer offers a reliable, user-friendly, and high-performance solution for spectroscopy applications in materials science, pharmaceuticals, chemical analysis, semiconductor research, environmental studies, nanotechnology, optics, academic research, and industrial quality control laboratories.
Capabilities
Key Features
Technical Data
Specifications
| Parameter | Value |
|---|---|
| Instrument Type | UV-Vis-NIR Spectrophotometer |
| Measurement Principle | Ultraviolet, Visible, and Near-Infrared Optical Spectroscopy |
| Measurement Modes | Absorbance, Transmittance, Reflectance, Energy Measurement |
| Absorbance, Transmittance, Reflectance, Energy Measurement | Absorbance, Transmittance, Reflectance, Energy Measurement |
| Optical System | Single / Double Monochromator configurations available |
| Monochromator Type | Czerny-Turner, Littrow, Prism-Grating, or customizable optical systems |
| Detector Options | PMT, PbS, InGaAs, Silicon Photodiode, and other detector configurations |
| Light Sources | Deuterium Lamp, Tungsten-Halogen Lamp, Xenon Lamp options |
| Wavelength Accuracy | ±0.1 nm to ±1.0 nm depending on configuration |
| Wavelength Repeatability | ±0.05 nm to ±0.5 nm |
| Spectral Bandwidth | Configurable slit width and bandwidth options |
| Scan Speed | Multiple selectable scan speed modes |
| Photometric Range | Wide dynamic photometric measurement range |
| Photometric Accuracy | High photometric precision and stability |
| Noise Level | Low-noise optical and electronic system |
| Stray Light | Extremely low stray light characteristics |
| Baseline Stability | Long-term stable baseline performance |
| Integrating Sphere | Optional integrating sphere for diffuse/total reflectance measurements |
| Sample Compartment | Standard and large sample compartment options available |
| Sample Compatibility | Liquids, powders, films, coatings, glass, polymers, semiconductors, solids |
| Data Processing Features | Spectral smoothing, differentiation, area calculation, kinetics, quantitative analysis |
| Software Functions | Instrument control, spectral acquisition, analysis, data export, report generation |
| Data Export Formats | Excel, CSV, ASCII, PDF, and standard spectral formats |
| Operation Mode | Fully automated / semi-automated configurations available |
| Construction | Laboratory-grade vibration-resistant design |
| Power Supply | 220–240 V AC, 50/60 Hz |
| System Configuration | Modular and customizable architecture |
| Accessories | Integrating sphere, film holders, powder holders, temperature-controlled accessories, and optional modules |
| Applications | Material science, nanotechnology, pharmaceuticals, semiconductors, optics, research, QC |
| Customization | Configurations available as per application requirements |
Inquiry
Interested in the
UV-Vis-NIR Spectrophotometer?
Fill out the form and our product specialists will respond with pricing, lead times, and configuration options within one business day.